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Science
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Technology
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Metrology
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Products and Services
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Instruments
(7)
Open Directory - Science: Technology: Metrology: Products and Services: Instruments
Analytical Chemistry
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(56)
Barometers
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(27)
Flow Meters
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(48)
Materials Science
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(167)
Thermometers
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(93)
Weighing Scales
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(267)
See also:
Business: Industrial Goods and Services: Calibration and Testing: Equipment
(19)
Business: Industrial Goods and Services: Machinery and Tools: Test Equipment
(139)
Science: Instruments and Supplies: Laboratory Equipment
(1,536)
Area Detector Systems Corporation
- Manufacturer of CCD detectors, particularly in the x-ray range. Includes specifications, certification and technical support from Poway, California.
Axic, Inc.
- Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California.
Dacell Co., Ltd.
- Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea.
InsituTec
- Nanotechnology company providing macro-metrology products for measuring large scale parts with micro to nanometer accuracies and micro-metrology products with sensors based on standing wave technology.
LumaSense Technologies AS
- Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, contacts in Europe and headquarters in Santa Clara, California
Oxford Microbeams Ltd.
- Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.
Physical Electronics, Inc.
- Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation.
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Last update: Friday, July 30, 2010 2:03:35 AM EDT -
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